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U.S. Measurement System

Large-Area, Flexible Electronics and Photonics

March 6-7, 2006
NIST Advanced Measurement Laboratory
Gaithersburg, MD

Workshop Agenda (includes presentation materials)
Workshop Flyer available for printing

 

1. The United States Measurement System

NIST is leading an effort to document future needs for the United States Measurement System (USMS), the complex of all methods, instruments, entities, institutions, and standards involved in measurements of products and processes of significance to the economy, security, and quality of life. Now more than ever, there is a need to create a comprehensive mechanism to anticipate needed measurement infrastructure and to make informed strategic choices to achieve the greatest impact.

2. Large-Area, Flexible Electronics and Photonics

A technology area poised for significant growth is flexible, large-area electronics and photonics. An exciting array of new devices and applications are now possible with materials amenable to incorporation on flexible substrates, via low cost, high volume manufacturing. However, the systematic development of flexible, large area electronics is difficult because of the enormous range of potential materials and manufacturing methods. The concurrent development of multiple material platforms and processes, the demand for new diagnostic probes, tools, and methods and a lack of standardization may be limiting progress.

3. Objective

This workshop seeks to bring together stakeholders from industry, government, and academia to assess the measurement and standards infrastructure available to address technological challenges in flexible, large-area electronics and photonics and to identify significant gaps that must be closed. These needs may include new diagnostic probes, tools, and measurement protocols for an extensive array of potential materials, applications, and manufacturing methods. Discussions from the workshop will be compiled into a report that will be used to inform future investments in USMS infrastructure needed to support the development of this technology.

4. Organizing Committee

Eric Lin (eric.lin@nist.gov)
Michael Schen (michael.schen@nist.gov)
Robert Reuss
Frank Barros
Curt Richter
Lee Richter
Jan Obrzut
Dean DeLongchamp
Roger Van Zee
David Gundlach

5. Workshop Output - 1 page write-ups produced as a result of the workshopNEW!

On-line Registration

Workshop Agenda (includes presentation materials)

Workshop Flyer available for printing.

General inquiries on the USMS Workshop program may be forwarded to usms_workshops@nist.gov.

Last updated: July 9, 2007